Lucas Matana Luza - CV

Experience

OSMOS X

Bruz, France.

Embedded Software Engineer

09/2026 -- Current

SENAI Institute of Innovation in Embedded Systems

Florianópolis, Brazil.

Researcher

04/2023 -- 09/2026

  • I work as a technical reference for the software development of an industrial climbing robot for offshore inspection and maintenance applications, in a project funded by Shell and Petrobras.
  • My responsibilities include software architecture, system integration, robot control, hardware integration, industrial communication networks, operator interfaces, diagnostics and system validation.
  • I designed and implemented a distributed ROS 2-based software architecture integrating robot control, embedded Linux platforms, operator interfaces and industrial fieldbus communication.
  • I develop C++ applications using ROS 2, MoveIt 2 and ros2_control for robot control, supervision, diagnostics, hardware abstraction and system integration.
  • I integrate EtherCAT and CANopen devices into industrial robotic systems and configure DDS middleware for distributed and segmented communication.
  • I also work on embedded Linux software, real-time systems, RTOS-based platforms, Qt/RViz2 monitoring tools and low-level components for hardware integration, validation and debugging.
  • I collaborate with multidisciplinary teams across robotics, embedded systems, mechanical engineering, manufacturing and industrial automation.

Embedded Software Engineer - R&D Fellowship

09/2022 -- 03/2023

  • Worked on embedded software development for industrial and automotive applications, focusing on RTOS-based platforms, hardware integration, communication interfaces and system validation.
  • Developed low-level software components in C/C++ for embedded platforms, including communication, control, debugging and testing activities.
  • Contributed to applied R&D projects involving embedded systems, microcontroller-based platforms and hardware-integrated software.

LIRMM - CNRS

Montpellier, France.

Research Engineer - Embedded Systems

01/2022 -- 06/2022

  • I worked on embedded hardware and automated test systems for the radiation characterization of semiconductor memory devices, as part of a collaboration with the European Space Agency (ESA) and the Proba-V mission.
  • I developed FPGA-based and microcontroller-based control platforms for automated test environments, laboratory validation and experimental campaigns.
  • I developed software for test control, automated data acquisition, real-time monitoring, visualization and data analysis.
  • I integrated hardware platforms for radiation experiments and contributed to validation activities, instrumentation setup and experimental test campaigns.

LIRMM - University of Montpellier

Montpellier, France.

Doctoral Researcher - Embedded Systems

11/2018 -- 12/2021

  • Developed embedded systems, FPGA-based controllers and automated test platforms for the characterization of semiconductor memory devices and space-related electronic systems.
  • Designed and integrated custom electronic boards, control interfaces and data acquisition systems for hardware validation and experimental testing.
  • Developed C and Python software for test automation, instrumentation control, real-time monitoring, data acquisition and analysis.
  • Contributed to the MTCube CubeSat project through embedded monitoring systems, payload verification, hardware integration and pre-flight validation activities.
  • Collaborated with international research and engineering teams across Europe in projects related to embedded systems, radiation effects and space electronics.

SpaceLab - UFSC - CAPES

Florianópolis, Brazil.

Master's Researcher - Embedded Systems

08/2017 -- 10/2018

  • Developed FPGA-based communication platforms for CubeSat applications using radiation-hardened NanoXplore devices.
  • Implemented communication and control modules in VHDL for aerospace and embedded systems applications.
  • Contributed to the Payload-X embedded payload platform and its integration concept with the FloripaSat-1 CubeSat mission.
  • Performed hardware integration, validation and verification activities for FPGA-based embedded systems.

Sigma Electrical Equipments

Lagoa Vermelha, Brazil.

Electrical Engineering Intern

10/2015 -- 08/2016

  • Developed solutions for internal operational needs in an industrial manufacturing environment.
  • Provided technical support for electrical systems used in manufacturing equipment and production processes.
  • Conducted testing and validation activities for electrical transformers, supporting quality control and product verification.

Diula Center

Lagoa Vermelha, Brazil.

Manager

03/2011 -- 09/2016

  • Sales and purchase management.
  • Implementation of stock control.
  • Financial assistant.
  • Customer service management.

Education

Ph.D. in Automatic and Microelectronic Systems

2018 -- 2021

Analysis of space and atmospheric radiation-induced effects on memory devices

École Doctorale Information Structures Systêmes (I2S)
University of Montpellier (UM)
Montpellier, France

Master in Electrical Engineering

2017 -- 2019

A contribution to the in-orbit validation of a radiation-hardened communication platform to be used in small satellite

Graduate Program in Electrical Engineering (PPGEEL)
Federal University of Santa Catarina (UFSC)
Florianópolis - SC, Brazil

Bachelor in Electrical Engineering

2012 -- 2017

Electroencephalogram acquisition module

Electrical Engineering
University of Passo Fundo (UPF)
Passo Fundo - RS, Brazil

Projects

Investigation on Intra-Die Variability and Radiation-Induced SEL in a COTS SRAM Memory Flying on Proba-V

Study of heavy-ion induced effects in a COTS SRAM based on Single-Event Latch-Up and SEU testing focusing on identifying the variability within the samples.

2021 -- 2022

Activities:
  • Project management.
  • Hardware development for the test setup with a focus on a current/voltage monitoring system for Single-Event Latch-Up detection.
  • Software development for test setup based on Python scripts to handle a live data visualization during the testing.
  • Device testing under heavy-ion radiation to be carried out at RADEF .
  • Software development for data analysis based on Python scripts for data correlation and radiation-induced events classification.
Collaborations:

MTCube - Memory Test CubeSat

The MTCube embeds the RES (Radiation Effects Study) experiment. RES is a payload developed by the LIRMM team containing COTS memories devices that were extensively studied and characterized under different types of radiation sources under accelerated beams (e.g, Heavy-Ions, Protons, and others). The main purpose of the mission is to characterize the sensitivity of different types of memories with respect to the space radiation environment focusing on Single-Event Effects.

2018 -- 2022

Activities:
  • Test and validation of the RES payload.
  • Development of a real-time monitoring system based on Django (Python web framework) to follow the in-flight scientific data generated by the payload.
Collaborations:
Related publications:
[C10] Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
[C9] Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

A Model-Based Framework for the Reliability Assessment of Safety-Critical Applications based on Artificial Neural Networks

This is a conjunction work between several universities targeting the reliability assessment of safety-critical applications based on ANNs (Artificial Neural Networks) that explores the Approximate Computing aspects, the impact of the hardware on the type of faults, and the methodologies of fault injection campaigns.

2020 -- 2022

Activities:
  • PCB desing for hosting a DDR Self-Refresh DRAM ( HyperRAM ) to be integrated with the ZedBoard development kit using the FMC Interface.
  • Implementation of a HyperBus memory controller for the Zynq-7000 System-on-Chip.
  • Implementation of the LeNet-5 Convolutional Neural Network on the Zynq-7000 System-on-Chip using C language.
  • Development of the test setup for radiation test campaigns under atmospheric-like neutorn beam at ChipIr .
  • Software development for data analysis based on Python scripts.
Collaborations:
Related publications:
[PHD] Analysis of space and atmospheric radiation-induced effects on memory devices
[J5] Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
[C18] Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
[C15] A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
[C13] Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Payload-X

Payload for cubesats using the NG-Medium rad-hard FPGA from Nanoxplore , with the institutional support from the European Space Agency ( ESA ).

2019

Activities:
  • NG-Medium FPGA implementation (VHDL, and NanoXplore tools) of a communication platform based on the CCSDS protocols to enable an in-orbit validation of the device.
  • Integration concept with the FloripaSat-1 CubeSat.
Collaborations:
Related publications:
[MSC] A contribution to the in-orbit validation of a radiation-hardened communication platform to be used in small satellite
[C6] A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites
[C4] Enabling Deep-Space Cubesat Missions Through State-of-the-Art Radiation-Hardened Technologies

Academic

Publications


Journal Articles

[J10] SRAM-based heavy ion beam flux and LET dosimetry
A. Coronetti, R. García-Alía, L. Dilillo, C. Imianosky, D. A. Dos Santos, L. M. Luza, A. Bosser, K. Bilko, A. Waets, K. Klimek, F. Saigné
IEEE Transactions on Nuclear Science, 2024

[J9] Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring
André Martins Pio De Mattos, Douglas A. Santos, L. M. Luza, Viyas Gupta, and Luigi Dilillo
Electronics, 2024

[J8] Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V
André Martins Pio De Mattos, Douglas A. Santos, L. M. Luza, Viyas Gupta, Thomas Borel, and Luigi Dilillo
IEEE Transactions on Nuclear Science, 2024

[J7] Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs
Daniel Söderström, L. M. Luza, André Martins Pio De Mattos, Thierry Gil, Heikki Kettunen, Kimmo Niskanen, Arto Javanainen, and Luigi Dilillo
IEEE Transactions on Nuclear Science, 2023

[J6] A Survey on Deep Learning Resilience Assessment MethodologiesA Survey on Deep Learning Resilience Assessment Methodologies
A. Ruospo, E. Sanchez, L. M. Luza, L. Dilillo, M. Traiola and A. Bosio
Computer, 2022

[J5] Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
L. Matana Luza, A. Ruospo, D. Söderström, C. Cazzaniga, M. Kastriotou, E. Sanchez, A. Bosio, and L. Dilillo
IEEE Transactions on Emerging Topics in Computing (TETC), 2021

[J4] Neutron-Induced Effects on a Self-Refresh DRAM
L. Matana Luza, D. Söderström, H. Puchner, R. G. Alía, M. Letiche, C. Cazzaniga, A. Bosio, and L. Dilillo
Microelectronics Reliability, 2022

[J3] On the Evaluation of FPGA Radiation Benchmarks
G. Bricas, G. Tsiligiannis, A. Touboul, J. Boch, M. Kastriotou, C. Cazzaniga, C. D. Frost, L. Dilillo, and L. Matana Luza
Microelectronics Reliability, 2021

[J2] Reliability Analysis of a Fault-Tolerant RISC-V System-on-Chip
D. A. Santos, L. Matana Luza, L. Dilillo, C. A. Zeferino, and D. R. Melo
Microelectronics Reliability, 2021

[J1] Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
D. Söderström, L. Matana Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Gilardi, A. Coronetti, C. Poivey, and L. Dilillo
IEEE Transactions on Nuclear Science (TNS), 2021

Conferences Papers

[C21] Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
Douglas A. Santos, André M. P. Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022
[C20] Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
Lucas M. Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo
2022 IEEE European Test Symposium (ETS), 2022
[C19] Effects of High-Energy Protons on a Self-Refresh DRAM
Lucas Matana Luza, Carolina Imianosky, André Martins Pio de Mattos, Douglas Almeida dos Santos, Daniel Söderström, and Luigi Dilillo
18th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE), 2022
[C18] Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
A. Ruospo, L. Matana Luza, A. Bosio, M. Traiola, L. Dilillo and E. Sanchez
IEEE Latin American Test Symposium (LATS), 2021
[C17] Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study
L. Matana Luza, D. Söderström, A. M. P. de Mattos, E. A. Bezerra, C. Cazzaniga, M. Kastriotou, C. Poivey and L. Dilillo
16th International Conference on Design \& Technology of Integrated Systems in Nanoscale Era (DTIS), 2021
[C16] Characterization of a RISC-V System-on-Chip under Neutron Radiation
D. A. Santos, L. Matana Luza, M. Kastriotou, C. Cazzaniga, C. A. Zeferino, D. R. Melo, and L. Dilillo
16th International Conference on Design \& Technology of Integrated Systems in Nanoscale Era (DTIS), 2021
[C15] A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
L. Matana Luza, A. Ruospo, A. Bosio, E. Sanchez, and L. Dilillo
24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2021
[C14] Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
D. Söderström, L. Matana Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Coronetti,C. Poivey, and L. Dilillo
2020 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2020
[C13] Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
L. Matana Luza, D. Söderström, G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, and L. Dilillo
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020
[C12] Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
L. Matana Luza, D. Söderström, H. Puchner, R. G. Alía, M. Letiche, A. Bosio, and L. Dilillo
15th Design Technology of Integrated Systems in Nanoscale Era (DTIS), 2020
[C11] A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems
D. A. Santos, L. Matana Luza, C. A. Zeferino, L. Dilillo, and D. R. Melo
15th Design Technology of Integrated Systems in Nanoscale Era (DTIS), 2020
[C10] Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
L. Matana Luza, A. Bosser, V. Gupta, A. Javanainen, A. Mohammadzadeh, and L. Dilillo
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019
[C9] Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash
V. Gupta, A. Bosser, L. Matana Luza, D. Söderström, A. Javanainen, H. Kettunen, J. Praks, A. Virtanen, and L. Dilillo
19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019
[C8] Stuck and Weakened SDRAM Cells Due to Heavy-Ion Irradiation
D. Söderström, L. Matana Luza, A. Bosser, T. Gil, K. Voss, H. Kettunen, A. Javanainen, and L. Dilillo
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019
[C7] Design and Implementation of a Flexible Interface for TID Detector
I. Fara, L. Matana Luza, J. Boch, G. Furano, M. Ottavi, and L. Dilillo
IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI), 2019
[C6] A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites
C. A. Rigo, L. Matana Luza, E. D. Tramontin, V. Martins, S. V. Martinez, L. K. Slongo, L. O. Seman, L. Dilillo, F. L. Vargas, and E. A. Bezerra
IEEE Latin American Test Symposium (LATS), 2019
[C5] Design of an EEG Acquisition System Based on Front-End ADS1292
L. Matana Luza, F. R. Andreis, and A. F. Balotin
XXVI Brazilian Congress on Biomedical Engineering, 2018
[C4] Enabling Deep-Space Cubesat Missions Through State-of-the-Art Radiation-Hardened Technologies
L. Matana Luza, C. A. Rigo, E. D. Tramontin, V. M. G. Martins, S. V. Martínez, L. K. Slongo, L. O. Seman, L. Dilillo, and E. Bezerra
3rd IAA Latin American CubeSat Workshop (IAA-LACW), 2018
[C3] Módulo de Aquisição de Sinais de Eletroencefalograma
[EN] Electroencephalogram Signal Acquisition Module
L. Matana Luza, and A. Balotin
III Semana do Conhecimento UPF, 2016
[C2] Monitoramento de Umidade e Temperatura via Raspberry PI 3
[EN] Monitoring Humidity and Temperature with a Raspberry PI 3
V. J. Petry, G. Benedetti, L. Matana Luza, L. Arpini, N. B. Nicoli, and J. M. Levandoski
II Congresso Internacional de Gestão, Tecnologia e Inovação da URI (CONIGTI) & III Congresso Sul-Brasileiro de Engenharia de Alimentos (CSBEA), 2016
[C1] Power Inverters Using Sinusoidal PWM Modulation Technique
G. Benedetti, J. C. S. da Silva, L. Matana Luza, L. H. Arpini, V. J. Petry, and E. S. Acco
Congresso Regional de Iniciação Científica e Tecnológica em Engenharia (CRICTE), 2016

Conferences Presentations without Publication

[P1] Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
L. Matana Luza, D. Söderström, G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, and L. Dilillo
AxC20: 5TH Workshop on Approximate Computing in conjunction with DAC'20, 2020

Activities

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

Awards

Outstanding Student Paper Award

October, 2020

Work: Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
Organization: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Outstanding Student Paper Award

October, 2019

Work: Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
Organization: 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems